Grade: prime/ test
Size：4"~12"
Type: N/P
Orientation: <100>/<111>
Resistivity: normal range *If you have special specifications, please contact us!
Wafer type: polished/epitaxial/SOI/compound(SiC, GaN)
The customer plans to verify the detection capability of the defect inspection equipment, so wafers with various defects are required;
In addition, customers also require that "defects" on wafers must have relevant factory inspection reports to facilitate comparison.
Wafers with such special needs and very small quantities are not easy to obtain. If you have special needs for semiconductor wafer materials, you are welcome to call or leave a message!
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